#analog

#logparanoia()

Welcome to KAPSEL Homepage

= Open Software for Direct Numerical Simulations of Particle Dispersions =

single.jpg shear_dc_s.jpg 127.jpg

____Electro-Hydrodynamics________________Rheology________________________Micro-Fluidics

What is KAPSEL?

  • KAPSEL means "Kyoto Advanced Particle Simulator for Electro-hydrodynamics" based on a direct numerical simulation method for colloidal dispersions called SPM (Smoothed Profile Method). KAPSEL is designed to simulate dynamics of solid particles dispersed in simple and complex fluids. KAPSEL enables us to simulate complex rheological properties of colloidal dispersions, electrophoresis of charged colloids, etc.
  • KAPSEL-3 is the latest version of KAPSEL. It enables DNS simulations of rigid bodies composed of spherical particles and also self-propelled swimmers (squirmers).
  • KAPSEL-2 introduced thermal fluctuations to the system and also perform rheology simulations under steady or oscillatory shear flow being fully compatible with usual periodic boundary condition. Computational efficiency is also much improved from the original version so that one can simulate larger systems.

NEWS

  • KAPSEL-3
    • [01 June 2013] KAPSEL-3.01 release (bug fixed around the Lees-Edwards sheared periodic boundary condition)
    • [01 May 2013] KAPSEL-3.00 release (newly implemented rigid bodies and squirmers)
  • KAPSEL-2
    • [30 Mar 2011] KAPSEL-2.10 release (newly implemented the Lees-Edwards sheared periodic boundary condition)
  • [19 Aug 2009] KAPSEL-2.00 release
  • [04 Aug 2009] KAPSEL-2.beta pre-release
  • [31 May 2006] KAPSEL released.

Related Papers

  • Simulation method & algorithm
  • H. Kobayashi and R. Yamamoto, "Implementation of Lees-Edwards periodic boundary conditions for direct numerical simulations of particle dispersions under shear flow",
    J. Chem. Phys., 134, 064110 (2011).
  • Yasuya Nakayama, Kang Kim and Ryoichi Yamamoto, "Simulating (electro) hydrodynamic effects in colloidal dispersions: smoothed profile method",
    Eur. Phys. J. E, 26, 361-368 (2008).